champac

n.

黄兰（产于东印度）；黄蓝；

IDDQ testing of single floating gate defects using a two
Ruído de interconexiones em circuitos integrados CMOS submicrométricos
Built-in aging monitoring for safety-critical applications
Built-in aging monitoring for safety-critical applications
Detectability Conditions for Interconnection Open Defects
Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors
Testing of Resistive Opens in CMOS Latches and Flip-Flops
Logic testability of defective floating gate CMOS latches
Testability of floating gate defects in sequential circuits
Test of data retention faults in CMOS SRAMs using special DFT circuitries